The four-point probe resistivity tester is designed for measuring the resistivity (conductivity) and sheet resistance of conductors and semiconductors, such as ITO, IZO, conductive rubber, bulk metals, sputtered metal coatings, silicon wafers, etc.
Separate current and voltage lines eliminate errors caused by contact resistance and measurement line resistance, ensuring high accuracy.

This system consists of a resistivity tester, measurement fixture, computer, and control system.

Resistance measurement range: 0.1μΩ~3MΩ
Resistance measurement resolution: 0.1μΩ
Resistance measurement accuracy: ±0.5% F.S
Resistivity measurement range: 1x10??~1x10? Ω·cm
Temperature measurement range: 0~50℃
Temperature measurement accuracy: ±1℃
Console dimensions: L310 x W220 x H460 mm
Resistance test module dimensions: L325 x W215 x H97 mm
Power supply: AC220V 500W, rated current 3A
Resistance measurement method: DC
Probe diameter: φ1.5 (customizable upon request)
Probe spacing: 3mm (customizable upon request)
Equipped with network interface for remote control and data monitoring
Dual-electrode measurement method
Supports multiple measurement modes including conventional four-point probe and Rymaszewski four-point probe methods
Measurement current: 0.1μA ~1A, automatically switchable
Machine weight: 12kg