The Thick 800 X-ray fluorescence spectrometer is primarily designed for the non-destructive and rapid measurement of coating thickness and composition on large components. Unlike the downward-facing design and enclosed sample chamber of the EDX600B, it adopts an upward-facing configuration, utilizing three-dimensional movement and laser positioning to perform point measurements of coating thickness and composition on parts with larger dimensional ranges. Application areas: content detection of precious metals such as gold, platinum, and silver, as well as various jewelry; thickness measurement of metal coatings, determination of electroplating solution and coating composition; precious metal processing and jewelry manufacturing industries; banks, jewelry sales, and testing institutions; electroplating industry. ◆◆Technical specifications: ◆Element analysis range: from K to U ◆Capable of simultaneously analyzing multiple layers of coating in a single measurement ◆Detection limit for thickness analysis up to 0.01μm ◆Can analyze up to 5 or more layers of coating simultaneously ◆Mutually independent matrix effect correction models, advanced thickness analysis methods ◆Measurement repeatability up to 0.01μm ◆Long-term operational stability less than 0.1μm (for single-layer coating samples around 5μm) ◆Operating temperature range: 15°C to 30°C ◆Output voltage 220±5V/50HZ (recommended to configure an AC purified regulated power supply) ◆◆Configuration ◆Open sample chamber ◆Two-dimensional moving sample platform ◆Three-dimensional movement achieved via vertical adjustment of detector and X-ray tube ◆Dual laser positioning device ◆Automatic collimator switching device ◆Glass shielding cover ◆Proportional counter detector ◆Signal detection electronic circuit ◆High and low voltage power supply ◆X-ray tube ◆Computer and inkjet printer ◆Sample chamber dimensions: 517mm×352mm×150mm ◆Overall dimensions: 648mm×490mm×544mm