Micro-Area Sampling Instrument

JapanMicro Support Axis Pro Series

Introduction:

        The micro-area sampling instrument is a powerful auxiliary tool for micro-area analysis. In micro-infrared, micro-Raman,XRD,SEM, andTEMtesting, issues such as tiny samples being covered, embedded, or adhered are often encountered. Sometimes, it is difficult to collect signals from the target area, necessitating the extraction of the sample. Other times, the sample size being smaller than the instrument's detection limit poses many challenges. The micro-area sampling instrument can help users easily solve these problems. The high-precision micro-area sampling instrument, controlled by a mouse, automatically, multi-angle, and efficiently extracts tiny samples, facilitating further instrument analysis. This device is widely used in the analysis of tiny samples, foreign matter analysis, multi-layer composite material analysis, andFIBsample preparation assistance, playing an important role in quality control and product development in the display material industry.
 

Comprehensive Functionality:
        JapanMicroSupportmicro-area sampling instrument can be equipped with various precision micro-tools to handle micron-level samples. For example, micro-probes can be used to pick up samples on surfaces or in micro-pores, ultrasonic milling tools can remove surface coatings from samples, micro-tweezers can grasp samples in adhesives, collectors can enrich samples smaller than1μm, micro-cutters and vacuum suction tools can cut samples from a specific layer of composite materials, and even mark samples or quickly rotate and placeFIBprepared samples. All these tasks can be easily completed with the assistance of corresponding tools, creating conditions for subsequent detection and analysis.
 

Flexible Configuration:
        Modular design allows flexible assembly based on actual applications.

Versatile and Multi-Optional:

        MicroSupportmicro-area sampling instrument offers a wide range of sampling and sample preparation tools to choose from, including various materials, shapes, sizes, and functions. It comprehensively addresses the challenges of finding, sampling, and testing samples in micro-area analysis, leaving no blind spots.