N5183A Signal Generator N5183A Chengdu

The N5183A is an RF generator from Agilent with a frequency range of up to 40 GHz. RF generators are tools used by engineers to generate sinusoidal outputs when testing electronic devices. The output will automatically vary or sweep its frequency between frequencies. A "sweep" is one complete cycle of frequency variation. Engineers use RF signal generators as test equipment, primarily to measure the response of filters, amplifiers, and electronic components.

N5183A Signal Generator N5183A Chengdu Additional Features:

• Address parametric testing of microwave components and receivers

• Perform local oscillator (LO) upconversion for microwave backhaul links or CW blocking for receiver testing

• Maximize test throughput with 600s frequency switching

• Characterize microwave filters and amplifiers with excellent output power and level accuracy

N5183A Signal Generator N5183A Chengdu Signal Characteristics

• 100 kHz to 20, 31.8, or 40 GHz

• +18 dBm output power at 20 GHz

• ≤ 900 s frequency switching speed

• Typical phase noise ≤ -98 dBc/Hz at 20 kHz offset

N5183A Signal Generator N5183A Chengdu Modulation and Sweep

• AM, FM, ΦM, and pulse modulation

• < 10 ns pulse rise/fall time and 20 ns pulse width

• Digital and step sweep

N5183A Signal Generator N5183A Chengdu Automation and Communication Interfaces

• 100BaseT LAN, USB 2.0, and GPIB

• Compliant with LXI Class B standards

• SCPI and IVI-COM drivers

• Backward compatible with PSG, 8340, 8360, and 8370 series signal generators

The Agilent N5183A MXG Microwave Analog Signal Generator delivers the performance required for manufacturing broadband components up to 40 GHz. This instrument offers frequency switching of ≤ 900 s (typically ≤ 600 s) to reduce test time in applications such as antenna testing and manufacturing, and features a compact size (2RU) for better rack space utilization. Its power and level accuracy make the MXG Microwave a reliable stimulus for driving high-power devices. The MXG Microwave can be configured to meet your current testing needs, from LO replacement and CW interference to analog modulation for device characterization, and can be easily upgraded to meet your future requirements.