Compact Benchtop Scanning Electron Microscope offers multiple imaging parameters for users to choose from, meeting the adjustment needs of professional users; equipped with various probes, it enables multiple analytical methods for samples.

Unlike vertical electron microscopes, the CEM3000 series Compact Benchtop Scanning Electron Microscope does not require a large amount of space to accommodate the entire system, allowing it to be placed on the user's daily work desk, delivering results in real time at hand. Additionally, this series of benchtop electron microscopes can also perform effectively in confined spaces such as glove boxes, vehicle compartments, or submersibles. Even in working environments where conventional electron microscopes struggle, this series demonstrates excellent performance with its anti-vibration and anti-magnetic technology.

Product Features

1) The compact design of the benchtop electron microscope allows the CEM3000 series to overcome space limitations, offering true spatial adaptability. Users can even place it conveniently on their desktops. The CEM3000 can also be easily relocated as needed, making it versatile for multiple locations;

2) High resolution enables observation and analysis of micro-scale features, meeting users' observation requirements;

3) Rapid pumping and venting, thanks to the vacuum system design, reduces waiting time for users;

4) High usability allows for quick imaging and one-click image output. With automatic adjustment functions, users can obtain high-quality images without extensive manual operation;

5) Large sample chamber: While maintaining a compact size, the CEM3000A features a chamber comparable to vertical electron microscopes, accommodating larger samples;

6) High anti-vibration and anti-magnetic performance: The entire series boasts excellent interference resistance. The CEM3000B, in particular, utilizes proprietary technology and composite anti-vibration methods to elevate scanning electron microscope vibration resistance to new heights;

7) Optional low vacuum mode allows users to set the vacuum level in the sample chamber as needed, enabling observation of various sample types;

8) Offers multiple imaging parameters for users to choose from, meeting the adjustment needs of professional users;

9) The Compact Benchtop Scanning Electron Microscope is equipped with various probes, enabling multiple analytical methods for samples.

Model Selection

(Large Chamber Type): 70mm×70mm sample chamber, compatible with large-sized or multiple sample batch analysis.

(Anti-Vibration Type): Designed specifically for vibrating environments, faster pumping (low vacuum only 40 seconds), and more stable imaging.

Application Scenarios

Materials Science: Microstructural analysis of nanomaterials (e.g., 60nm silver wires), high-entropy alloy powders, zinc oxide, etc.

New Energy: Defect detection in solar panels, coating performance evaluation.

Biomedical: Surface morphology observation of microfluidic chips, drug carrier research.

Industrial Quality Inspection: Solder ball welding quality, surface roughness detection of precision components.

Application Cases

Metal Material Analysis

Pollen Microstructure

Partial Technical Specifications

Please note: Due to market developments and product development needs, the content in this product documentation may be updated or modified at any time without prior notice. We appreciate your understanding.

For any inquiries or further details, please feel free to contact Chotest Instruments for consultation.