Product Introduction

       After the transformer is designed and manufactured, its internal structure and various parameters remain essentially unchanged, so the frequency domain response of each winding is also determined. For a transformer with normal windings, the coupling degree of its three-phase frequency domain response curves is basically consistent. When inter-turn or phase-to-phase short circuits occur during testing, or when short circuits or other faults cause winding displacement due to electromagnetic forces during operation, or when collisions during transportation cause relative displacement of windings, these factors will alter the distributed parameters of the transformer, resulting in changes in its frequency domain response. The degree of transformer deformation can be determined based on the frequency domain response curve. Based on this concept and advanced measurement technology, our company has developed and produced the NDBX-Ⅳ Transformer Winding Deformation Tester. This instrument can accurately plot the frequency domain response curves of each phase, and by comparing the curves horizontally and vertically, it can accurately determine the degree of transformer deformation.

         NDBX-Ⅳ Transformer Winding Deformation Tester complies with the DL/T911 2004 standard "Frequency Response Analysis Method for Transformer Winding Deformation of Power Transformers".

Product Features

☆ Advanced DDS sweep frequency technology

☆ Dual power supply: AC220V±10% mains power, and internal 6V5AH battery

☆ High-speed, highly integrated microprocessor design

☆ Sine wave amplitude adjustable via software

☆ Dual-channel 16-bit AD sampling

☆ 8-inch color touch screen with adjustable brightness

☆ Saves up to 120 sets of measurement data for easy access or upload to a PC

☆ Powerful PC software for curve analysis, printing, and generating Word documents

☆ USB 2.0 interface for data upload and online testing

☆ Host dimensions: 35mm x 210mm x 210mm

☆ Host weight: approximately 5kg

Technical Parameters

☆ Six different scanning modes:

      Linear 1K～1000kHz_1.0, step 1kHz (1000 points)

      Linear 1K～1000kHz_0.5, step 0.5kHz (2000 points)

      Linear 1K～2000kHz_1.0, step 1kHz (2000 points)

      Linear 1K～2000kHz_0.5, step 0.5kHz (4000 points)

      Segmented 100Hz～1000kHz (1440 points)

      Segmented 100Hz～2000kHz (2440 points)

☆ Measurement range: (-100dB) to (+20dB)

☆ Measurement accuracy: 0.1dB

☆ Sweep frequency accuracy: 0.01%

☆ Signal input impedance: 1MΩ

☆ Signal output impedance: 50Ω

☆ In-phase test repeatability: 99.5%